Electron Beam Lithography and Plasma Etching To Fabricate Supports for Studying Nanomaterials
Abstract
The fabrication processes of different nano- structures by electron beam lithography (EBL) and plasma dry etching are shown. The periodic circle and square patterns with different sizes were defined in the resist by EBL and then formed in the substrates by plasma etching. The holes were created with a diameter ranging from 1um to 5um and an etch depth from around 500nm to 1um. The quality and the size of fabricated patterns and their dependence on the etching time were investigated using top-down and cross-sectional scanning electron microscopy (SEM). It was found that the structures are well-resolved in the patterns with high levels of quality and good size uniformity. The results show that the depth of the structures does not depend on their size or geometry but rather on the etch time.

This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.
Copyright & License
All Research Plus Journals (RPJ) publish open access articles under the terms of the Creative Commons Attribution (CC BY-SA 4.0) https://creativecommons.org/licenses/by-sa/4.0/ License which permits use, distribution and reproduction in any medium, provided the original work is properly cited & ShareAlike terms followed.
Copyright on any research article in a journal published by a RPJ is retained by the author(s). Authors grant RPJ a license to publish the article and identify itself as the original publisher. Upon author(s) by giving permission to RPJ either via RPJ journal portal or other channel to publish their research work in RPJ agrees to all the terms and conditions of https://creativecommons.org/licenses/by-sa/4.0/ License and terms & condition set by RPJ.
3rd party copyright
It is the responsibility of author(s) to secure all necessary copyright permissions for the use of 3rd-party materials in their manuscript.
Disclaimer
Research Plus Journals Open Access articles posted to repositories or websites are without warranty from RPJ of any kind, either express or implied, including, but not limited to, warranties of merchantability, fitness for a particular purpose, or non-infringement. To the fullest extent permitted by law RPJ disclaims all liability for any loss or damage arising out of, or in connection, with the use of or inability to use the content.












